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Littelfuse transient suppression diodes provide lower dynamic resistance

作者: 来源: 日期:2018-10-19 11:51:35 人气:48

Typical applications of SR05 series of transient suppression diode arrays include protecting T1 / E1 / T3 / E3 lines, Ethernet 10baset lines, LAN / WAN devices, ISDNS / T interfaces, video lines, microcontroller inputs, USB 1.1 ports and other high-speed interfaces.


" SR05 series products can provide lightning surge protection of up to 25A with a maximum clamping voltage of 18V, 10 % lower than similar industrial solutions." According to Chadmarak, director of Littelfuse's transient suppression diode array series. " In addition, SR05 is also an ideal choice for protecting high-speed data line interfaces due to its low load capacitance ( 6.0 pF, 40 % lower than similar products on the market ). This means that circuit designers do not have to abandon stable protection to maintain signal integrity. "


SR05 series of transient suppression diode arrays have the following key characteristics and advantages:


Functions and Features


Very low dynamic resistance ( RDYN ), only 0.3Ω


The capacitance from I / O to ground is extremely low, only 6PF


Strong surge protection: lightning strike, IEC 61000 - 4 - 5,25A ( 8 / 20S ); Peak pulse power, 450 W ( 8 / 20s )


Enhanced ESD protection capability: IEC 61000 - 4 - 2, 30kV ( contacts ), 30kV ( air )


Characteristic


The clamping voltage is at least 10 % lower than that of similar competing products. Provides better protection for modern / small chipsets against industry-defined transients


Capacitance is 40 % lower than similar solutions on the market; Helps to maintain signal integrity and minimize data loss during transmission


Higher power and surge handling capabilities can provide a higher design margin for electrical threats than industry standards


The enhanced ESD protection performance far exceeds the highest level ( 8kV ) of IEC 61000 - 4 - 2 standard, helping manufacturers adopting SR05 series devices in their products to ensure the highest on-site reliability


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